Technical transform in wear-resisting layer of detector probe
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Abstract
In order to solve the problems that often occur for wear-resisting layer of old detector probes in testing and to avoid the failure of testing data caused by the damaged layer, three technical transform schemes are compared. Finally, it is concluded that zirconia ceramic chip is highly resistant to wear and has no influence on the signal acquisition. The dynamic experiment in national engineering laboratory proves that the new probe with zirconia ceramic chip as wear-resisting layer has better wear-resistance and fatigue resistance than the old ones. The detector with improved wear-resisting layer probe is successfully applied in the testing of Dongguan Products Pipeline. After the detection of 161 km pipeline, the probe is free of damage and testing data is intact. Therefore, it provides a reference to the technical transform of similar probes.
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